Index Catalog // MDR

Description/Abstract:: In response to a progress of data-driven science in the materials science field, NIMS (National Institute for Materials Science) started ...
Keyword:: 研究データ, データフロー, 相互利用 FAIR, 材料データプラットフォーム DICE, データリポジトリ, メタデータスキーマ, and マテリアル・インフォマティクス
Resource Type:: Article
Author:: TANIFUJI, Mikiko and YOSHIKAWA, Hideki
Journal:: 情報処理学会論文誌デジタルプラクティス
Date Uploaded:: 25/08/2021
Date Modified:: 25/08/2021

Description/Abstract:: 磁気ヘッド材料として用いられているFeNi:5 nm/CoFeB:3 nm/FeNi:10 nm多層薄膜の深さ方向組成分布を調べるために，極低角度入射イオンビームを用いたオージェ深さ方向分析によりイオン加速電圧0.5 kVおよび3.0 kVのスパッタ条件で分析を行った．その...
Keyword:: Auger Depth Profiling Analysis, Ultra Low Angle Incidence Ion Beam, and FeNi/CoFeB/FeNi Thin Film
Material/Specimen:: FeNi/CoFeB/FeNi Thin Film
Resource Type:: Article
Author:: Ogiwara, Toshiya, Yanagiuchi, Katsuaki, and Yoshikawa, Hideki
Journal:: Journal of Surface Analysis
Date Uploaded:: 28/05/2021
Date Modified:: 04/06/2021

Description/Abstract:: We have investigated the Auger depth profiling analysis of HfO2/Si by the glancing-angle ion beam sputtering method at an incident angle ...
Keyword:: Auger Depth Profiling analysis, HfO2/Si, and Ultra Low Angle Incidence Ion Beam
Material/Specimen:: HfO2
Resource Type:: Article
Author:: Yoshikawa, Hideki, Ogiwara, Toshiya, and Nagata, Takahiro
Journal:: Journal of Surface Analysis
Date Uploaded:: 25/05/2021
Date Modified:: 26/05/2021

Description/Abstract:: We have calculated mean escape depths (MEDs, D) of photoelectrons from Si, Cu, and Au excited by linearly polarized X-rays over the 50 to...
Keyword:: MED, asymmetry parameter, high-energy photoelectron spectroscopy, lnearly polarized X-rays, and mean escape depth
Resource Type:: Article
Author:: Tanuma, Shigeo, Yoshikawa, Hideki, Shinotsuka, Hiroshi, and Ueda, Ryuichi
Journal:: Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:: 26/06/2020
Date Modified:: 02/07/2021

Description/Abstract:: With the development of data-driven research, an efficient and practical data collection system is required. National Institute for Mater...
Keyword:: データアーキテクチャ, IoT, データ収集システム, メタデータ, and XML スキーマ
Resource Type:: Article
Author:: MATSUNAMI, Shigeyuki, MATSUDA, Asahiko, CHIKYOW, Toyohiro, HARADA, Yoshitomo, and YOSHIKAWA, Hideki
Journal:: 情報処理学会論文誌デジタルプラクティス
Date Uploaded:: 26/08/2021
Date Modified:: 26/08/2021

Description/Abstract:: 電子線マイクロアナライザーは広く材料の分析に用いられ，定量分析法はZAF法としてほぼ確立されている．しかし，Mg-Ge合金においては，定量分析の結果MgとGeの濃度の合計120wt.% と異常な値を示した．しかも電子線の加速電圧が高くなるに従ってMgの定量値が上昇する．こ...
Keyword:: Mg-Ge alloy, ZAF, electron probe microanalyzer, and mass absorption coefficient
Resource Type:: Article
Author:: Nishio, Mitsuaki, Imai, Motoharu, Tanuma, Shigeo, Yoshikawa, HIdeki, and Isoda, Yukihiro
Journal:: Journal of Surface Analysis
Date Uploaded:: 20/07/2020
Date Modified:: 22/07/2020

Description/Abstract:: There is a need to develop an automatic spectral analysis method integrated with reference database as the reference database builds up. ...
Keyword:: X-ray photoelectron spectroscopy, Automatic spectrum analysis, Bayesian information criterion, and Multiple core level spectra
Resource Type:: Article
Author:: Murakami, Ryo, Tanaka, Hiromi, Shinotsuka Hiroshi, Nagata, Kenji, and Yoshikawa, Hideki
Journal:: Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:: 15/06/2022
Date Modified:: 17/06/2022

Description/Abstract:: We developed and implemented a fully automated method to perform X-ray photoelectron spectroscopy (XPS) spectral analysis based on the ac...
Keyword:: X-ray photoelectron spectroscopy (XPS), Active Shirley method, Akaike information criterion (AIC), and Bayesian information criterion (BIC)
Resource Type:: Article
Author:: Shinotsuka, Hiroshi, Yoshikawa, Hideki, Murakami, Ryo, Nakamura, Kazuki, Tanaka, Hiromi, and Yoshihara, Kazuhiro
Journal:: Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:: 10/06/2022
Date Modified:: 17/06/2022

Description/Abstract:: We calculated electron inelastic mean free paths (IMFPs) for liquid water from its optical energy-loss function (ELF) for electron energi...
Keyword:: EAL, Electron Inelastic Mean Free Path, IMFP, effective attenuation length, liquid water, relativistic TPP-2M, relativistic full Penn algorithm, and static structure factor
Resource Type:: Article
Author:: Shinotsuka, Hiroshi, Da, Bo, Tanuma, Shigeo, Yoshikawa, Hideki, Powell , Cedric J, and Penn, David R
Journal:: Surface and Interface Analysis
Date Uploaded:: 31/07/2020
Date Modified:: 02/07/2021

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