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Filtering by: Keyword four-dimensional scanning transmission electron microscopy Language English Publisher Elsevier BV

1. Non-negative matrix factorization for mining big data obtained using four-dimensional scanning transmission electron microscopy

Description/Abstract:: Scientific instruments for material characterization have recently been improved to yield big data. For instance, scanning transmission e...
Keyword:: electron microscopy, four-dimensional scanning transmission electron microscopy, and non-negative matrix factorization
Resource Type:: Article
Author:: Fumihiko Uesugi, Shogo Koshiya, Jun Kikkawa, Takuro Nagai, Kazutaka Mitsuishi, and Koji Kimoto
Journal:: Ultramicroscopy
Date Uploaded:: 02/08/2022
Date Modified:: 03/08/2022