Skip to Content
Toggle navigation
Home
About
Help
Contact
Login
Search MDR
Go
Search Constraints
Start Over
Filtering by:
Keyword
electron microscopy
Remove constraint Keyword: electron microscopy
1
-
2
of
2
Sort by relevance
relevance
date uploaded ▼
date uploaded ▲
date modified ▼
date modified ▲
Number of results to display per page
10 per page
10
per page
20
per page
50
per page
100
per page
View results as:
List
Gallery
Masonry
Slideshow
Search Results
1.
Ptychographical reconstruction code by Wigner Distribution Deconvolution (WDD)
Description/Abstract:
Codes for Ptychographical reconstruction by WDD method and aberration measuremnt. The codes were originally developed by Katsuaki Naka...
Keyword:
ptychography
,
4DSTEM
,
electron microscopy
,
Wigner distribution deconvolution
, and
aberration correction
Resource Type:
Software or Program Code
Data origin:
other
Author:
Nakazawa Katsuaki
and
Mitsuishi Kazutaka
Date Uploaded:
01/12/2022
Date Modified:
07/02/2023
2.
Non-negative matrix factorization for mining big data obtained using four-dimensional scanning transmission electron microscopy
Description/Abstract:
Scientific instruments for material characterization have recently been improved to yield big data. For instance, scanning transmission e...
Keyword:
electron microscopy
,
four-dimensional scanning transmission electron microscopy
, and
non-negative matrix factorization
Resource Type:
Article
Author:
Fumihiko Uesugi
,
Shogo Koshiya
,
Jun Kikkawa
,
Takuro Nagai
,
Kazutaka Mitsuishi
, and
Koji Kimoto
Journal:
Ultramicroscopy
Date Uploaded:
02/08/2022
Date Modified:
03/08/2022
Toggle facets
Limit your search
Type of work
Dataset
1
Publication
1
Keyword
electron microscopy
[remove]
2
4DSTEM
1
Wigner distribution deconvolution
1
aberration correction
1
four-dimensional scanning transmission electron microscopy
1
more
Keywords
»
Language
English
1
Publisher
Elsevier BV
1
Resource type
Article
1
Software or Program Code
1
Visibility
open
2
Rights Statement Sim
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
1
MIT
1
Data origin
other
1
Characterization methods
microscopy -- scanning transmission electron microscopy
1
Author
Fumihiko Uesugi
1
Jun Kikkawa
1
Kazutaka Mitsuishi
1
Koji Kimoto
1
Mitsuishi Kazutaka
1
more
Authors
»
Journal
Ultramicroscopy
1