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Filtering by: Keyword HAXPES Remove constraint Keyword: HAXPES Publisher AIP Publishing Remove constraint Publisher: AIP Publishing

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Local defect and mid-gap state analysis of GaN using monochromated EELS combined with ...

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Type of work

Publication1

Keyword

4D-STEM1
ABF-STEM1
EELS1
GaN1
HAADF-STEM1
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Language

English1

Publisher

AIP Publishing[remove]1

Resource type

Article1

Visibility

open1

Rights Statement Sim

Creative Commons BY Attribution 4.0 International1

Author

Jun Kikkawa1
Koji Kimoto1
Ryoji Arai1
Sei Fukushima1
Shunsuke Yamashita1
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Journal

APL Materials1

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