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Local defect and mid-gap state analysis of GaN using monochromated EELS combined with nanodiffraction and atomic-resolution imaging
Description/Abstract:
Enhancement of energy resolution due to evolution of monochromators has made electron energy loss spectroscopy (EELS) in transmission ele...
Keyword:
4D-STEM
,
ABF-STEM
,
EELS
,
GaN
,
HAADF-STEM
,
HAXPES
, and
defect
Resource Type:
Article
Author:
Shunsuke Yamashita
,
Sei Fukushima
,
Jun Kikkawa
,
Ryoji Arai
,
Yuya Kanitani
,
Koji Kimoto
, and
Yoshihiro Kudo
Journal:
APL Materials
Date Uploaded:
19/03/2024
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Creative Commons BY Attribution 4.0 International
1
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Jun Kikkawa
1
Koji Kimoto
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