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1. Rutile-type GexSn1−xO2 alloy layers lattice-matched to TiO2 substrates for device applications

Description/Abstract:: We report the characterization and application of mist-CVD-grown rutile-structured GexSn1−xO2 (x = ∼0.53) films lattice-matched to isostr...
Keyword:: GeO2, SnO2, and TiO2
Resource Type:: Article
Author:: Hitoshi Takane, Takayoshi Oshima, Takayuki Harada, Kentaro Kaneko, and Katsuhisa Tanaka
Journal:: Applied Physics Express
Date Uploaded:: 30/01/2024
Date Modified:: 01/02/2024