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Filtering by: Keyword FeNi/CoFeB/FeNi Thin Film Remove constraint Keyword: FeNi/CoFeB/FeNi Thin Film

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Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incidence Ion Beam

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Type of work

Publication1

Keyword

Auger Depth Profiling Analysis1
FeNi/CoFeB/FeNi Thin Film [remove]1
Ultra Low Angle Incidence Ion Beam1

Language

Japanese1

Publisher

Surface Analysis Society of Japan1

Resource type

Article1

Visibility

open1

Rights Statement Sim

In Copyright1

Material/Specimen

FeNi/CoFeB/FeNi Thin Film 1

Author

Ogiwara, Toshiya1
Yanagiuchi, Katsuaki1
Yoshikawa, Hideki1

Journal

Journal of Surface Analysis1

National Institute for Materials Science

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