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(Zn, Cr) Te
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Ultrathin specimen preparation by a low energy Ar ion milling method
Description/Abstract:
An ultra low energy ion milling method was used to prepare ultrathin specimen for transmission electron microscope observation. The sampl...
Keyword:
(Zn, Cr) Te
,
Ar-ion milling
,
gamma-Ga2O3
,
low-energy ion beam
,
sample preparation
, and
ultrathin specimen
Resource Type:
Article
Author:
Masanori Mitome
Journal:
MICROSCOPY (JOURNAL OF ELECTRON MICROSCOPY)
Date Uploaded:
04/03/2024
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Keyword
(Zn, Cr) Te
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1
Ar-ion milling
1
gamma-Ga2O3
1
low-energy ion beam
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sample preparation
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English
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Oxford University Press (OUP)
1
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1
Author
Masanori Mitome
1
Journal
MICROSCOPY (JOURNAL OF ELECTRON MICROSCOPY)
1