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Filtering by: Instrument manufacturer Ritsumeikan SR Center Keyword Nitride Keyword XAFS

XAFS spectrum of Hexagonal boron nitride

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at N K-edge of Hexagonal boron nitride measured at Ritsumeikan-SR...

Keyword:

BL-11, Hexagonal boron nitride, N K-edge, Nitride, Ritsumeikan-SR, XAFS, collection - MDR XAFS DB, and h-BN

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022
XAFS spectrum of Hexagonal boron nitride

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at B K-edge of Hexagonal boron nitride measured at Ritsumeikan-SR...

Keyword:

B K-edge, BL-11, BN, Hexagonal boron nitride, Nitride, Ritsumeikan-SR, XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022
XAFS spectrum of Silicon nitride

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon nitride measured at Ritsumeikan-SR BL-10,...

Keyword:

BL-10, Nitride, Ritsumeikan-SR, Si K-edge, Si3N4, Silicon nitride, XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022