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Filtering by: Instrument manufacturer Ritsumeikan SR Center Keyword Na4SiO4 Keyword Si K-edge

XAFS spectrum of Sodium orthosilicate

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Sodium orthosilicate measured at Ritsumeikan-SR B...

Keyword:

BL-10, Na4SiO4, Ritsumeikan-SR, Si K-edge, Silicate, Sodium orthosilicate, XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022