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Filtering by: Instrument manufacturer Japan Synchrotron Radiation Research Institute Keyword C32H16N8Ni Keyword Nickel(II) phthalocyanine

1. XAFS spectrum of Nickel(II) phthalocyanine

Description/Abstract:: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ni K-edge of Nickel(II) phthalocyanine measured at SPring-8 BL...
Keyword:: BL14B2, C32H16N8Ni, Ni K-edge, Nickel(II) phthalocyanine, Phthalocyanine, SPring-8, Si(111), XAFS, and collection - MDR XAFS DB
Material/Specimen:: Nickel(II) phthalocyanine
Resource Type:: Dataset
Data origin:: experiments
Contact person:: Industrial Application and Partnership Division
Date Uploaded:: 24/07/2021

2. XAFS spectrum of Nickel(II) phthalocyanine

Description/Abstract:: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ni K-edge of Nickel(II) phthalocyanine measured at SPring-8 BL...
Keyword:: BL14B2, C32H16N8Ni, Ni K-edge, Nickel(II) phthalocyanine, Phthalocyanine, SPring-8, Si(311), XAFS, and collection - MDR XAFS DB
Material/Specimen:: Nickel(II) phthalocyanine
Resource Type:: Dataset
Data origin:: experiments
Contact person:: Industrial Application and Partnership Division
Date Uploaded:: 23/07/2021