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Filtering by: Instrument managing sub organization Ritsumeikan SR Center Keyword Silicon dioxide (Quartz) Keyword Si K-edge

1. XAFS spectrum of Silicon dioxide (Quartz)

Description/Abstract:: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon dioxide (Quartz) measured at Ritsumeikan-...
Keyword:: BL-10, Oxide, Ritsumeikan-SR, Si K-edge, SiO2(quartz), Silicon dioxide (Quartz), XAFS, and collection - MDR XAFS DB
Resource Type:: Dataset
Data origin:: experiments
Date Uploaded:: 08/06/2022