Index Catalog // MDR

Start Over

Filtering by: Instrument managing organization Ritsumeikan University Keyword Nitride Keyword Ritsumeikan-SR Keyword Si K-edge

XAFS spectrum of Silicon nitride

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon nitride measured at Ritsumeikan-SR BL-10,...

Keyword:

BL-10, Nitride, Ritsumeikan-SR, Si K-edge, Si3N4, Silicon nitride, XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022