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Arイオンスパッタリングされた各種化合物半導体表面のSEM観察
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Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incidence Ion Beam
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High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Holder based on Geometric Characteristics of Auger Electron Spectroscopy Apparatus Equipped with Concentric Hemispherical Analyzer
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Combination of recommender system and single-particle diagnosis for accelerated discovery of novel nitrides
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A universal Bayesian inference framework for complicated creep constitutive equations
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Data-based selection of creep constitutive models for high-Cr heat-resistant steel
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試料冷却法を併用したAES深さ方向分析によるSiO2/Si熱酸化膜の分析
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InP/GaInAs多層膜のAES深さ方向分析のラウンドロビン試験報告(I)
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English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
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材料データプラットフォームシステムDICEにおける研究データフローの構築―実践と課題
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CASベースのRDM認証・認可機構の漸増開発とアセスメント評価
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IoT データ収集システムのデータアーキテクチャ
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Emergent dynamics of neuromorphic nanowire networks
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Ultra High Depth Resolution Auger Depth Profiling by Both Electron and Ion Beams at the Glancing Incidence using an Inclined Specimen Holder
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Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy. Effects of Zalar Rotation and Liquid Nitrogen Cold Stage
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Depth Profiling Analysis of InP/GaInAsP Multilayer Structure with Auger Electron Spectroscopy by Using Argon Ion Spot Beam
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Auger Depth Profile Analysis of GaAs/AIAs Thin Film by Synthesized Spectrum Method Using Non-Negative Least Square Curve Fitting
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Auger Depth Profiling Analyses of InP/GaInAsP Multilayers
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Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy, Quantitative Evaluation of the Surface Roughness Caused by Ion Sputtering
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Experimental Determination of Electron Inelastic Mean Free Paths in 13 Elemental Solids in the 50 eV to 5000 eV Energy Range by Elastic-Peak Electron Spectroscopy
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