Index Catalog // MDR

Combination of recommender system and single-particle diagnosis for accelerated discovery of novel nitrides

Description/Abstract:: Discovery of new compounds from wide chemical space is attractive for materials researchers. However, theoretical prediction and validati...
Keyword:: materials search, materials informatics, and density functional theory calculation
Material/Specimen:: nitrides
Resource Type:: Article
Author:: KOYAMA, Yukinori, SEKO, Atsuto, TANAKA, Isao, FUNAHASHI, Shiro, and HIROSAKI, Naoto
Journal:: The Journal of Chemical Physics
Date Uploaded:: 15/06/2021
Date Modified:: 17/06/2021

High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Holder based on Geometric Characteristics of Auger Electron Spectroscopy Apparatus Equipped with Concentric Hemispherical Analyzer

Description/Abstract:: 半球型電子分光器を搭載したオージェ電子分光装置では，傾斜ホルダーを用いると装置のジオメトリー特性との関係からイオン及び一次電子の入射角の自由度が大きくなる.特に試料回転の回転軸が一次電子の入射方向と一致する場合は，傾斜ホルダーの回転角によってイオン入射角を設定でき，電...
Keyword:: Auger Depth Profiling Analysis, Inclined Holder, GaAs/AlAs Superlattice, and Si/Ge multiple delta-doped layers
Material/Specimen:: GaAs/AlAs Superlattice and Si/Ge multiple delta-doped layers
Resource Type:: Article
Author:: Ogiwara, Toshiya, Nagatomi, Takaharu, Kim, Kyung Joong, and Tanuma, Shigeo
Journal:: Journal of Surface Analysis
Date Uploaded:: 14/06/2021
Date Modified:: 18/06/2021

Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incidence Ion Beam

Description/Abstract:: 磁気ヘッド材料として用いられているFeNi:5 nm/CoFeB:3 nm/FeNi:10 nm多層薄膜の深さ方向組成分布を調べるために，極低角度入射イオンビームを用いたオージェ深さ方向分析によりイオン加速電圧0.5 kVおよび3.0 kVのスパッタ条件で分析を行った．その...
Keyword:: Auger Depth Profiling Analysis, Ultra Low Angle Incidence Ion Beam, and FeNi/CoFeB/FeNi Thin Film
Material/Specimen:: FeNi/CoFeB/FeNi Thin Film
Resource Type:: Article
Author:: Ogiwara, Toshiya, Yanagiuchi, Katsuaki, and Yoshikawa, Hideki
Journal:: Journal of Surface Analysis
Date Uploaded:: 28/05/2021
Date Modified:: 04/06/2021

Arイオンスパッタリングされた各種化合物半導体表面のSEM観察

Description/Abstract:: 各種化合物半導体の表面をArイオンでスパッタリングして，その表面のSEM観察を行なった．そして，イオンスパッタリング時の試料温度および試料回転の有無と表面形状の関係を系統的に調べた．その結果，表面あれはスパッタリングされた表面全体に生成する場合とコーン状の突起物がランダムに...
Keyword:: compound semiconductor, surface observation using a scanning electron microscope, and argon ion sputtering
Material/Specimen:: InP, InSb, InAs, GaAs, GaSb, and GaP
Resource Type:: Article
Author:: Ogiwara, Toshiya and Tanuma, Shigeo
Journal:: Journal of Surface Analysis
Date Uploaded:: 28/05/2021
Date Modified:: 04/06/2021

InP/GaInAsP多層膜におけるAES深さ分解能の温度依存性

Description/Abstract:: InP/GaInAsP多層膜を用いて，AES深さ方向分析における深さ分解能の試料温度依存性について検討を行なった．試料温度は，０〜５０℃（１０℃間隔）およびー１２０，−２０℃の８条件としてデプスプロファイルを取得した．スパッタリング条件は，イオン種：Ar，イオン加速電圧：1...
Keyword:: InP/GaInAsP多層膜, Auger Depth Profiling Analysis, Depth Resolution, and Sample Temperature
Material/Specimen:: InP/GaInAsP Multilayer Film
Resource Type:: Article
Author:: Ogiwara, Toshiya and Tanuma, Shigeo
Journal:: Journal of Surface Analysis
Date Uploaded:: 28/05/2021
Date Modified:: 28/05/2021

Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam

Description/Abstract:: We have investigated the Auger depth profiling analysis of HfO2/Si by the glancing-angle ion beam sputtering method at an incident angle ...
Keyword:: Auger Depth Profiling analysis, HfO2/Si, and Ultra Low Angle Incidence Ion Beam
Material/Specimen:: HfO2
Resource Type:: Article
Author:: Yoshikawa, Hideki, Ogiwara, Toshiya, and Nagata, Takahiro
Journal:: Journal of Surface Analysis
Date Uploaded:: 25/05/2021
Date Modified:: 26/05/2021

Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids over the 50 eV to 200 keV range with the relativistic full Penn algorithm

Description/Abstract:: <h4>Abstract</h4> We have calculated inelastic mean free paths (IMFPs) for 41 elemental solids (Li, Be, graphite, diamond, glassy C, Na,...
Keyword:: electron inelastic mean free path, inelastic mean free paths, predictive equation for IMFP, elemental solid, relativistic Bethe equation, Fano plot, IMFP, ELF, energy loss function, optical constant, relativistic full Penn algorithm, full Penn algorithm, FPA, TPP-2M, and relativistic TPP-2M
Material/Specimen:: 41 elemental solids (Li, Be, graphite, diamond, glassy C, Na, Mg, Al, Si, K, Sc, Ti, V, Cr, Fe, Co, Ni, Cu, Ge, Y, Nb, Mo, Ru, Rh, Pd, Ag, In, Sn, Cs, Gd, Tb, Dy, Hf, Ta, W, Re, Os, Ir, Pt, Au, and Bi)
Resource Type:: Article
Author:: Shinotsuka, Hiroshi, TANUMA, Shigeo, Powell, Cedric J., and Penn, David R.
Journal:: Surface and Interface Analysis
Date Uploaded:: 01/04/2021
Date Modified:: 19/07/2021

Free Analysis and Visualization Programs for Electrochemical Impedance Spectroscopy Coded in Python

Description/Abstract:: New programs for fitting using an equivalent circuit model and data visualization of electrochemical impedance spectroscopy were develope...
Keyword:: data visualization, electrochemical impedance, free software, and model fitting
Resource Type:: Video, Article, and Software or Program Code
Author:: SUZUKI, Tohru S. and KOBAYASHI, Kiyoshi
Journal:: Electrochemistry
Date Uploaded:: 08/02/2021
Date Modified:: 10/02/2021

SuperMat: Construction of a linked annotated dataset from superconductors-related publications

Description/Abstract:: A growing number of papers are published in the area of superconducting materials science. However, novel text and data mining (TDM) pro...
Keyword:: annotation, annotation guidelines, dataset, superconductors, and tdm
Resource Type:: Article
Author:: FOPPIANO, Luca, DIEB, Sae, SUZUKI, Akira, BAPTISTA DE CASTRO, Pedro, IWASAKI, Suguru, UZUKI, Azusa, ESPARZA ECHEVARRIA, Miren Garbine, MENG, Yan, TERASHIMA, Kensei, TAKANO, Yoshihiko, and ISHII, Masashi
Date Uploaded:: 07/01/2021
Date Modified:: 01/07/2021

Coalescence delay of microbubbles on superhydrophobic/superhydrophilic surfaces underwater

Description/Abstract:: Inspired by penguins, the formation of an air film on surfaces underwater has been well-researched for the potential reduction of drag. H...
Keyword:: microbubble, superhydrophilic, and superhydrophobic
Resource Type:: Article
Author:: Ng, Chen Xian, Kawase, Yudai, and Doi, Kotaro
Contact person:: Naito, Masanobu and Tenjimbayashi, Mizuki
Journal:: Applied Physics Letters
Date Uploaded:: 02/01/2021
Date Modified:: 13/01/2021

Combination of recommender system and single-particle diagnosis for accelerated discovery of novel nitrides

High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Holder based on Geometric Characteristics of Auger Electron Spectroscopy Apparatus Equipped with Concentric Hemispherical Analyzer

Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incidence Ion Beam

Arイオンスパッタリングされた各種化合物半導体表面のSEM観察

InP/GaInAsP多層膜におけるAES深さ分解能の温度依存性

Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam

Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids over the 50 eV to 200 keV range with the relativistic full Penn algorithm

Free Analysis and Visualization Programs for Electrochemical Impedance Spectroscopy Coded in Python

SuperMat: Construction of a linked annotated dataset from superconductors-related publications

Coalescence delay of microbubbles on superhydrophobic/superhydrophilic surfaces underwater

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