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Introduction of Mille-Feuille-Like α/β Layered Structure into Ti–Mo Alloy
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Reduction of the Ordered Magnetic Moment by Quantum Fluctuation in the Antiferromagnetic Spin-5 2 Dimer Compound FeVMoO7
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Evaluation of field-induced magnetic moments in the spin-1/2 antiferromagnetic trimerized chain compound Cu3(P2O6OD)2
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Emergent spin-1 Haldane gap and ferroelectricity in a frustrated spin-1/2 ladder
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G-Quadruplex Structure Improves the Immunostimulatory Effects of CpG Oligonucleotides
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Magnetism of the spin-1 tetramer compound A2Ni2Mo3O12 (A = Rb or K)
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Magnetism of the antiferromagnetic spin-3/2 dimer compound CrVMoO7 having an antiferromagnetically ordered state
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Magnetism of the antiferromagnetic spin-1/2 tetramer compound CuInVO5
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A Possible Magnetic Structure of the Cluster-Based Haldane Compound Fedotovite K2Cu3O(SO4)3
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Program for automatic numerical conversion of a line graph (line plot)
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Conduction band caused by oxygen vacancies in aluminum oxide for resistance random access memory
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Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
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Bioinspired adhesive polymer coatings for efficient and versatile corrosion resistance
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Coalescence delay of microbubbles on superhydrophobic/superhydrophilic surfaces underwater
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Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
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InP/GaInAsP多層膜におけるAES深さ分解能の温度依存性
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Arイオンスパッタリングされた各種化合物半導体表面のSEM観察
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Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incidence Ion Beam
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High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Holder based on Geometric Characteristics of Auger Electron Spectroscopy Apparatus Equipped with Concentric Hemispherical Analyzer
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Combination of recommender system and single-particle diagnosis for accelerated discovery of novel nitrides
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