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In situ Transmission Electron Microscopy Observation of Melted Germanium Encapsulated in Multilayer Graphene
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Polarity Does Not Matter: Molecular Weight Reverses the Photoisomerization-Induced Phase Separation of an Azobenzene-Bearing Polymer
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Development of novel bone‐like nanocomposite coating of hydroxyapatite/collagen on titanium by modified electrophoretic deposition
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Ionic Liquid Interface as a Cell Scaffold
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Strain‐Sensitive On‐Surface Ladderization by Non‐Dehydrogenative Heterocyclization
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Pressureless sintering of LRH nanoplates on amorphous alumina for near-infrared GAP:Mn4+ transparent ceramic film
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Unconventional Giant “Magnetoresistance" in Bosonic Semiconducting Diamond Nanorings
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Direct measurement and verification of cohesive zone model parameters for basalt/PP rods using the transverse tensile test and virtual double cantilever beam test
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Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
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