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Filtering by: Funder JSPS KAKENHI Keyword grain boundary Keyword transmission electron microscopy Rights Statement Sim Creative Commons BY Attribution 4.0 International

1. Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline Materials

Description/Abstract:: This paper reviews quantitative characterization via transmission electron microscopy (TEM) and its application to interfacial phenomena ...
Keyword:: electron energy loss spectroscopy, energy dispersive X-ray spectroscopy, grain boundary, interphase boundary, and transmission electron microscopy
Resource Type:: Article
Author:: Seiichiro Ii
Journal:: Materials
Date Uploaded:: 02/04/2024

1. Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline Materials

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1. Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline Materials

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