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Filtering by: Journal Journal of Electron Spectroscopy and Related Phenomena Keyword mean escape depth

Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Linearly Polarized X-rays for High-Energy Photoelectron Spectroscopy

Description/Abstract:

We have calculated mean escape depths (MEDs, D) of photoelectrons from Si, Cu, and Au excited by linearly polarized X-rays over the 50 to...

Keyword:

MED, asymmetry parameter, high-energy photoelectron spectroscopy, lnearly polarized X-rays, and mean escape depth

Resource Type:

Article

Author:

Tanuma, Shigeo, Yoshikawa, Hideki, Shinotsuka, Hiroshi, and Ueda, Ryuichi

Journal:

Journal of Electron Spectroscopy and Related Phenomena

Date Uploaded:

26/06/2020

Date Modified:

02/07/2021