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JOURNAL OF SURFACE ANALYSIS
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AES
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オージェ電子分光法における背面散乱補正 I．広い分析条件で使用可能な電子の背面散乱補正式の開発
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AES
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Auger electron spectroscopy
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electron backscattering correction
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predictive formula for back scattering correction
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Japanese
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一般社団法人 表面分析研究会
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Creative Commons BY-NC Attribution-NonCommercial 4.0 International
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田沼 繁夫
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JOURNAL OF SURFACE ANALYSIS
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