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Filtering by: Journal JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA Publisher Elsevier BV Resource type Article

Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator

Description/Abstract:

We have developed a framework for solving the inverse problem of X-ray photoelectron spectroscopy (XPS) by incorporating an XPS simulator...

Keyword:

Bayesian estimation, Exchange Monte Carlo method, SESSA, and X-ray photoelectron spectroscopy

Resource Type:

Article

Author:

Hiroshi Shinotsuka, Kenji Nagata, Malinda Siriwardana, Hideki Yoshikawa, Hayaru Shouno, and Masato Okada

Journal:

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA

Date Uploaded:

25/08/2023

Date Modified:

25/08/2023