Index Catalog // MDR

Description/Abstract:: The prediction of electron inelastic mean free paths (IMFPs) from simple material parameters is a challenging problem in studies using el...
Keyword:: inelastic mean free path and machine learning
Resource Type:: Article
Author:: Xun Liu, Lihao Yang, Zhufeng Hou, Bo Da, Kenji Nagata, Hideki Yoshikawa, Shigeo Tanuma, Yang Sun, and Zejun Ding
Date Uploaded:: 11/04/2023

Description/Abstract:: Plasmon gain by core-level electrons or elastic electrons observed in past studies seems to be of no practical value in material characte...
Keyword:: Plasmon Energy Gain and Secondary Electron
Resource Type:: Article
Author:: Bo Da, Jiangwei Liu, Yoshitomo Harada, Nguyen T. Cuong, Kazuhito Tsukagoshi, Jin Hu, Lihao Yang, Zejun Ding, Hideki Yoshikawa, and Shigeo Tanuma
Date Uploaded:: 11/04/2023
Date Modified:: 11/04/2023

Description/Abstract:: Measuring the electron-transport properties of substrate-supported nanomaterials with the traditional two-point comparison method is diff...
Keyword:: four-point probe technique, inelastic mean free path, and monolayer graphene
Resource Type:: Article
Author:: Bo Da, Yang Sun, Zhufeng Hou, Jiangwei Liu, Nguyen Thanh Cuong, Kazuhito Tsukagoshi, Hideki Yoshikawa, Shigeo Tanuma, Jin Hu, Zhaoshun Gao, and Zejun Ding
Date Uploaded:: 04/04/2023
Date Modified:: 05/04/2023

Description/Abstract:: データ駆動型研究の進展に伴い，効率的かつ実用的なデータ収集の仕組みが求められている．物質・材料研究機構では，主に計測・プロセスデータを対象としたデータ収集システムを構築し運用を行っている．本システムでは非ネットワーク環境に置かれている実験装置の制御 PC 等に対して通信セキ...
Keyword:: データアーキテクチャ, IoT, データ収集システム, メタデータ, and XML スキーマ
Resource Type:: Article
Author:: MATSUNAMI, Shigeyuki, MATSUDA, Asahiko, CHIKYOW, Toyohiro, HARADA, Yoshitomo, and YOSHIKAWA, Hideki
Journal:: 情報処理学会論文誌デジタルプラクティス
Date Uploaded:: 26/08/2021
Date Modified:: 26/08/2021

Description/Abstract:: 材料分野でのデータ駆動型の材料研究の進展を受けて，物質･材料研究機構（National Institute for Materials Science, NIMS）は，材料データプラットフォームシステムの開発に 2017 年に着手し，2020年からサービス名 DICE ...
Keyword:: 研究データ, データフロー, 相互利用 FAIR, 材料データプラットフォーム DICE, データリポジトリ, メタデータスキーマ, and マテリアル・インフォマティクス
Resource Type:: Article
Author:: TANIFUJI, Mikiko and YOSHIKAWA, Hideki
Journal:: 情報処理学会論文誌デジタルプラクティス
Date Uploaded:: 25/08/2021
Date Modified:: 25/08/2021

Description/Abstract:: We have investigated the Auger depth profiling analysis of HfO2 /Si by the glancing angle ion beam sputtering method at an incident angle...
Keyword:: Auger Depth Profiling Analysis, HfO2/Si, and Ultra Low Angle Incidence Ion Beam
Material/Specimen:: HfO2
Resource Type:: Article
Author:: Ogiwara, Toshiya, Nagata, Takahiro, and Yoshikawa, Hideki
Journal:: Journal of Surface Analysis
Date Uploaded:: 19/08/2021
Date Modified:: 20/08/2021

Description/Abstract:: 磁気ヘッド材料として用いられているFeNi:5 nm/CoFeB:3 nm/FeNi:10 nm多層薄膜の深さ方向組成分布を調べるために，極低角度入射イオンビームを用いたオージェ深さ方向分析によりイオン加速電圧0.5 kVおよび3.0 kVのスパッタ条件で分析を行った．その...
Keyword:: Auger Depth Profiling Analysis, Ultra Low Angle Incidence Ion Beam, and FeNi/CoFeB/FeNi Thin Film
Material/Specimen:: FeNi/CoFeB/FeNi Thin Film
Resource Type:: Article
Author:: Ogiwara, Toshiya, Yanagiuchi, Katsuaki, and Yoshikawa, Hideki
Journal:: Journal of Surface Analysis
Date Uploaded:: 28/05/2021
Date Modified:: 04/06/2021

Description/Abstract:: We have investigated the Auger depth profiling analysis of HfO2/Si by the glancing-angle ion beam sputtering method at an incident angle ...
Keyword:: Auger Depth Profiling analysis, HfO2/Si, and Ultra Low Angle Incidence Ion Beam
Material/Specimen:: HfO2
Resource Type:: Article
Author:: Yoshikawa, Hideki, Ogiwara, Toshiya, and Nagata, Takahiro
Journal:: Journal of Surface Analysis
Date Uploaded:: 25/05/2021
Date Modified:: 26/05/2021

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