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Hideki Yoshikawa
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English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysi...
Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle In...
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence ...
Automatic Experimental Data Collection System Using a Wireless LAN Capable SD Card as ...
Calculations of Electron Inelastic Mean Free Paths. XI. Data for Liquid Water for Ener...
電子線マイクロアナライザーによるMg-Ge合金の定量 -Mg Kαに対するGeの質量吸収係数の検討- and Electron microprobe analysis of...
Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Li...
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Publication
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17
Collection
The history of DICE and NIMS Digital Library
3
Keyword
Ultra Low Angle Incidence Ion Beam
3
Auger Depth Profiling Analysis
2
HfO2/Si
2
IoT
2
X-ray photoelectron spectroscopy
2
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Language
English
10
Japanese
7
Publisher
Surface Analysis Society of Japan
4
Elsevier
3
American Physical Society (APS)
2
情報処理学会
2
American Chemical Society (ACS)
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Article
15
Presentation
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open
17
Rights Statement Sim
In Copyright
8
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
6
Creative Commons BY Attribution 4.0 International
3
Material/Specimen
HfO2
2
FeNi/CoFeB/FeNi Thin Film
1
Date accepted
2017
1
2019
1
2020
1
Date submitted
2019
1
Author
Yoshikawa, Hideki
7
Hideki Yoshikawa
5
Bo Da
4
Shigeo Tanuma
4
YOSHIKAWA, Hideki
4
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License
https://creativecommons.org/licenses/by-nc-nd/4.0/
3
https://creativecommons.org/licenses/by/4.0/
1
Funder
JSPS KAKENHI
1
JST CREST
1
Journal
Journal of Surface Analysis
4
Journal of Electron Spectroscopy and Related Phenomena
2
情報処理学会論文誌デジタルプラクティス
2
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
1
Journal of Electron Spectroscopy and Related Phenomena
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