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Filtering by: Author Zejun Ding Keyword four-point probe technique Publisher American Physical Society (APS)

Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene

Description/Abstract:

Measuring the electron-transport properties of substrate-supported nanomaterials with the traditional two-point comparison method is diff...

Keyword:

four-point probe technique, inelastic mean free path, and monolayer graphene

Resource Type:

Article

Author:

Bo Da, Yang Sun, Zhufeng Hou, Jiangwei Liu, Nguyen Thanh Cuong, Kazuhito Tsukagoshi, Hideki Yoshikawa, Shigeo Tanuma, Jin Hu, Zhaoshun Gao, and Zejun Ding

Date Uploaded:

04/04/2023

Date Modified:

05/04/2023