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Filtering by: Author Shinotsuka, Hiroshi Author Tanuma, Shigeo License https://creativecommons.org/licenses/by-nc-nd/4.0/ Type of work Publication

Calculations of Electron Inelastic Mean Free Paths. XI. Data for Liquid Water for Energies from 50 eV to 30 keV

Description/Abstract:

We calculated electron inelastic mean free paths (IMFPs) for liquid water from its optical energy-loss function (ELF) for electron energi...

Keyword:

EAL, Electron Inelastic Mean Free Path, IMFP, effective attenuation length, liquid water, relativistic TPP-2M, relativistic full Penn algorithm, and static structure factor

Resource Type:

Article

Author:

Shinotsuka, Hiroshi, Da, Bo, Tanuma, Shigeo, Yoshikawa, Hideki, Powell , Cedric J, and Penn, David R

Journal:

Surface and Interface Analysis

Date Uploaded:

31/07/2020

Date Modified:

02/07/2021
Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Linearly Polarized X-rays for High-Energy Photoelectron Spectroscopy

Description/Abstract:

We have calculated mean escape depths (MEDs, D) of photoelectrons from Si, Cu, and Au excited by linearly polarized X-rays over the 50 to...

Keyword:

MED, asymmetry parameter, high-energy photoelectron spectroscopy, lnearly polarized X-rays, and mean escape depth

Resource Type:

Article

Author:

Tanuma, Shigeo, Yoshikawa, Hideki, Shinotsuka, Hiroshi, and Ueda, Ryuichi

Journal:

Journal of Electron Spectroscopy and Related Phenomena

Date Uploaded:

26/06/2020

Date Modified:

02/07/2021
Calculations of electron inelastic mean free paths. XII. Data for 42 inorganic compounds over the 50 eV to 200 keV range with the full Penn algorithm

Description/Abstract:

We have calculated inelastic mean free paths (IMFPs) for 42 inorganic compounds (AgBr, AgCl, AgI, Al2O3, AlAs, AlN, AlSb, cubic BN, hexa...

Keyword:

Electron Inelastic Mean Free Path, IMFP, and TPP-2M

Resource Type:

Article

Author:

Shinotsuka, Hiroshi, Tanuma, Shigeo, Powell, Cedric J., and Penn, Dave R.

Journal:

Surface and Interface Analysis

Date Uploaded:

26/06/2020

Date Modified:

08/07/2021