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Seiichiro Ii
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Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline Materials
Description/Abstract:
This paper reviews quantitative characterization via transmission electron microscopy (TEM) and its application to interfacial phenomena ...
Keyword:
electron energy loss spectroscopy
,
energy dispersive X-ray spectroscopy
,
grain boundary
,
interphase boundary
, and
transmission electron microscopy
Resource Type:
Article
Author:
Seiichiro Ii
Journal:
Materials
Date Uploaded:
02/04/2024
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1
Keyword
electron energy loss spectroscopy
1
energy dispersive X-ray spectroscopy
1
grain boundary
1
interphase boundary
1
transmission electron microscopy
1
Language
English
1
Publisher
MDPI AG
1
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Article
1
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open
1
Rights Statement Sim
Creative Commons BY Attribution 4.0 International
1
Author
Seiichiro Ii
[remove]
1
Funder
JSPS KAKENHI
1
Journal
Materials
1