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Seiichiro Ii
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electron energy loss spectroscopy
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Quantitative Characterization by Transmission Electron Microscopy and Its Application ...
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electron energy loss spectroscopy
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energy dispersive X-ray spectroscopy
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grain boundary
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interphase boundary
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transmission electron microscopy
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English
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MDPI AG
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Author
Seiichiro Ii
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JSPS KAKENHI
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