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Filtering by: Author Seiichiro Ii Keyword electron energy loss spectroscopy

Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline Materials

Description/Abstract:

This paper reviews quantitative characterization via transmission electron microscopy (TEM) and its application to interfacial phenomena ...

Keyword:

electron energy loss spectroscopy, energy dispersive X-ray spectroscopy, grain boundary, interphase boundary, and transmission electron microscopy

Resource Type:

Article

Author:

Seiichiro Ii

Journal:

Materials

Date Uploaded:

02/04/2024