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Filtering by: Author Penn, D. R. Author パウエル Publisher National Institute for Materials Science

1. Inelastic Mean Free Paths, Mean Escape Depths, and Effective Attenuation Lengths for Surface Electron Spectroscopies

Description/Abstract:: While the IMFP is a basic material parameter, the EAL, MED, and ID depend not only on the IMFP but also on the instrumental configuration...
Keyword:: EAL, EPES, IMFP, elemental solids, inorganic compounds, and water
Resource Type:: Presentation
Author:: 田沼繁夫, 後藤啓典, 吉川英樹, パウエル, Penn, D. R., Da, B., Ueda, R., and Shinotsuka, H
Date Uploaded:: 29/06/2023