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Filtering by: Author Nagatomi, Takaharu Remove constraint Author: Nagatomi, Takaharu Keyword Auger Depth Profiling Analysis Remove constraint Keyword: Auger Depth Profiling Analysis Visibility open Remove constraint Visibility: open

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Ultra High Depth Resolution Auger Depth Profiling by Both Electron and Ion Beams at the Glancing Incidence using an Inclined Specimen Holder

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High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Holder based on Geometric Characteristics of Auger Electron Spectroscopy Apparatus Equipped with Concentric Hemispherical Analyzer

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Publication2

Keyword

Auger Depth Profiling Analysis[remove]2
GaAs/AlAs Superlattice2
Inclined Holder2
Si/Ge multiple delta-doped layers2

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Japanese2

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Surface Analysis Society of Japan1
The Surface Science Society of Japan1

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Article2

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open[remove]2

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Material/Specimen

GaAs/AlAs Superlattice1
GaAs/AlAs Superlattice and Si/Ge multiple delta-doped layers1
Si/Ge multiple delta-doped layers1

Author

Kim, Kyung Joong2
Nagatomi, Takaharu[remove]2
Ogiwara, Toshiya2
Tanuma, Shigeo2

Journal

Journal of Surface Analysis1
Journal of The Surface Science Society of Japan1

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