Index Catalog // MDR

Skip to Content

Home
About
Help
Contact
Login

Search MDR

Search Constraints

Start Over

Filtering by: Author Nagatomi, Takaharu Remove constraint Author: Nagatomi, Takaharu Journal Journal of Surface Analysis Remove constraint Journal: Journal of Surface Analysis Keyword Auger Depth Profiling Analysis Remove constraint Keyword: Auger Depth Profiling Analysis

1 entry found

relevance
date uploaded ▼
date uploaded ▲
date modified ▼
date modified ▲

Number of results to display per page

10 per page
20 per page
50 per page
100 per page

View results as:

List Gallery Masonry Slideshow

Search Results

Select an image to start the slideshow

High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Holder based on Geometric Characteristics of Auger Electron Spectroscopy Apparatus Equipped with Concentric Hemispherical Analyzer

1 of 1

Limit your search

Type of work

Publication1

Keyword

Auger Depth Profiling Analysis[remove]1
GaAs/AlAs Superlattice1
Inclined Holder1
Si/Ge multiple delta-doped layers1

Language

Japanese1

Publisher

Surface Analysis Society of Japan1

Resource type

Article1

Visibility

open1

Rights Statement Sim

In Copyright1

Material/Specimen

GaAs/AlAs Superlattice1
Si/Ge multiple delta-doped layers1

Author

Kim, Kyung Joong1
Nagatomi, Takaharu[remove]1
Ogiwara, Toshiya1
Tanuma, Shigeo1

Journal

Journal of Surface Analysis[remove]1

National Institute for Materials Science

Research Network and Facility Services Division (RNFS)
Materials Data Platform

© 2020–2024 National Institute for Materials Science. Works are available under licenses specified on their pages.

Terms of Use
Privacy Policy
Data Platform DICE
NIMS Digital Library