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Filtering by: Author Jun Uzuhashi Remove constraint Author: Jun Uzuhashi Author Kazuhiro Hono Remove constraint Author: Kazuhiro Hono Journal JOURNAL OF APPLIED PHYSICS Remove constraint Journal: JOURNAL OF APPLIED PHYSICS

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Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation

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Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing

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Publication2

Keyword

atom probe tomography2
gallium nitride2
cathodoluminescence1
implantation1
scanning transmission electron microscopy1
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Language

English2

Publisher

AIP Publishing2

Resource type

Article2

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open2

Rights Statement Sim

Creative Commons BY Attribution 4.0 International2

Author

Hideki Sakurai2
Jun Uzuhashi[remove]2
Kacper Sierakowski2
Kazuhiro Hono[remove]2
Michal Bockowski2
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Journal

JOURNAL OF APPLIED PHYSICS[remove]2

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