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Filtering by: Author Jun Kikkawa Publisher AIP Publishing

Local defect and mid-gap state analysis of GaN using monochromated EELS combined with nanodiffraction and atomic-resolution imaging

Description/Abstract:

Enhancement of energy resolution due to evolution of monochromators has made electron energy loss spectroscopy (EELS) in transmission ele...

Keyword:

4D-STEM, ABF-STEM, EELS, GaN, HAADF-STEM, HAXPES, and defect

Resource Type:

Article

Author:

Shunsuke Yamashita, Sei Fukushima, Jun Kikkawa, Ryoji Arai, Yuya Kanitani, Koji Kimoto, and Yoshihiro Kudo

Journal:

APL Materials

Date Uploaded:

19/03/2024
Fast electron damage mechanism of epoxy resin studied by electron energy loss spectroscopy and electron diffraction

Description/Abstract:

The damage mechanism and exposure tolerance of epoxy resins to fast electrons remain unclear. We quantitatively investigated the effec...

Keyword:

electron energy loss spectroscopy, epoxy resin, fast electron damage, and π electron

Resource Type:

Article

Author:

Jun Kikkawa, Aoi Nii, Yoshiaki Sakaniwa, Naochika Kon, Marina Sakamaki, Touyou Ohashi, Nobuyasu Nita, Koji Harano, and Koji Kimoto

Journal:

JOURNAL OF CHEMICAL PHYSICS

Date Uploaded:

01/12/2023

Date Modified:

01/12/2023