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Filtering by: Author Hayaru Shouno Author Hideki Yoshikawa Journal JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA Publisher Elsevier BV

Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator

Description/Abstract:

We have developed a framework for solving the inverse problem of X-ray photoelectron spectroscopy (XPS) by incorporating an XPS simulator...

Keyword:

Bayesian estimation, Exchange Monte Carlo method, SESSA, and X-ray photoelectron spectroscopy

Resource Type:

Article

Author:

Hiroshi Shinotsuka, Kenji Nagata, Malinda Siriwardana, Hideki Yoshikawa, Hayaru Shouno, and Masato Okada

Journal:

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA

Date Uploaded:

25/08/2023

Date Modified:

25/08/2023