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吉武 道子
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べき乗則で解釈されるスペクトルの閾値及びべき乗数の自動解析方法
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有機半導体材料における光電子収量分光(PYS)データベース構築
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Automatic estimation methods
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Power Law
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photoemission yield spectroscopy (PYS)
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National Institute for Materials Science
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表面分析研究会
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吉武 道子
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柳生 進二郎
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長田 貴弘
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中島嘉之
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劉雨彬
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Journal of Surface Analysis
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