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Filtering by: Characterization methods spectroscopy -- x-ray absorption spectroscopy Keyword Ta K-edge Material/Specimen Tantalum carbide

XAFS spectrum of Tantalum carbide

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ta K-edge of Tantalum carbide measured at SPring-8 BL14B2, and...

Keyword:

BL14B2, Carbide, SPring-8, Si(311), Ta K-edge, TaC, Tantalum carbide, XAFS, and collection - MDR XAFS DB

Material/Specimen:

Tantalum carbide

Resource Type:

Dataset

Data origin:

experiments

Contact person:

Industrial Application and Partnership Division

Date Uploaded:

24/07/2021