Index Catalog // MDR

Start Over

Filtering by: Characterization methods spectroscopy -- x-ray absorption spectroscopy Keyword Ta K-edge Keyword Ta3N5

XAFS spectrum of Tantalum nitride

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ta K-edge of Tantalum nitride measured at SPring-8 BL14B2, and...

Keyword:

BL14B2, Nitride, SPring-8, Si(311), Ta K-edge, Ta3N5, Tantalum nitride, XAFS, and collection - MDR XAFS DB

Material/Specimen:

Tantalum nitride

Resource Type:

Dataset

Data origin:

experiments

Contact person:

Industrial Application and Partnership Division

Date Uploaded:

24/07/2021