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Filtering by: Characterization methods spectroscopy -- x-ray absorption spectroscopy Keyword Si K-edge Keyword Silicon dioxide (Quartz)

XAFS spectrum of Silicon dioxide (Quartz)

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon dioxide (Quartz) measured at Ritsumeikan-...

Keyword:

BL-10, Oxide, Ritsumeikan-SR, Si K-edge, SiO2(quartz), Silicon dioxide (Quartz), XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022