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Filtering by: Characterization methods spectroscopy -- x-ray absorption spectroscopy Instrument manufacturer Ritsumeikan SR Center Keyword Ni L-edge Keyword NiO

1. XAFS spectrum of Nickel(II) oxide

Description/Abstract:: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ni L-edge of Nickel(II) oxide measured at Ritsumeikan-SR BL-11...
Keyword:: BL-11, Ni L-edge, NiO, Nickel(II) oxide, Oxide, Ritsumeikan-SR, XAFS, and collection - MDR XAFS DB
Resource Type:: Dataset
Data origin:: experiments
Date Uploaded:: 08/06/2022

1. XAFS spectrum of Nickel(II) oxide

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1. XAFS spectrum of Nickel(II) oxide

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