Index Catalog // MDR

Start Over

Filtering by: Characterization methods spectroscopy -- x-ray absorption spectroscopy Instrument manufacturer Photon Factory Keyword NiO

Description/Abstract:: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ni K-edge of Nickel(II) oxide measured at Photon Factory BL-12...
Keyword:: BL-12C, Ni K-edge, NiO, Nickel(II) oxide, Oxide, Photon Factory, Si(111), XAFS, and collection - MDR XAFS DB
Resource Type:: Dataset
Data origin:: experiments
Date Uploaded:: 08/07/2022

Limit your search