Filtering by: Characterization methods spectroscopy -- x-ray absorption spectroscopy Remove constraint Characterization methods: spectroscopy -- x-ray absorption spectroscopy Instrument manufacturer Japan Synchrotron Radiation Research Institute Remove constraint Instrument manufacturer: Japan Synchrotron Radiation Research Institute Keyword Ta K-edge Remove constraint Keyword: Ta K-edge Collection MDR XAFS DB Remove constraint Collection: MDR XAFS DB Material/Specimen Tantalum nitride Remove constraint Material/Specimen: Tantalum nitride