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Filtering by: Characterization methods spectroscopy -- x-ray absorption spectroscopy Instrument manufacturer Japan Synchrotron Radiation Research Institute Keyword Sn K-edge Material/Specimen Smartec-M

XAFS spectrum of Smartec-M

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Sn K-edge of Smartec-M measured at SPring-8 BL14B2, and is a p...

Keyword:

Alloy, BL14B2, SPring-8, Si(111), Smartec-M, Smartec-M (Mn3.1Zn0.5Sn0.4N), Sn K-edge, XAFS, and collection - MDR XAFS DB

Material/Specimen:

Smartec-M

Resource Type:

Dataset

Data origin:

experiments

Contact person:

Industrial Application and Partnership Division

Date Uploaded:

24/07/2021
XAFS spectrum of Smartec-M

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Sn K-edge of Smartec-M measured at SPring-8 BL14B2, and is a p...

Keyword:

Alloy, BL14B2, SPring-8, Si(311), Smartec-M, Smartec-M (Mn3.1Zn0.5Sn0.4N), Sn K-edge, XAFS, and collection - MDR XAFS DB

Material/Specimen:

Smartec-M

Resource Type:

Dataset

Data origin:

experiments

Contact person:

Industrial Application and Partnership Division

Date Uploaded:

23/07/2021

XAFS spectrum of Smartec-M

XAFS spectrum of Smartec-M

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