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Filtering by: Characterization methods spectroscopy -- x-ray absorption spectroscopy Data origin experiments Instrument manufacturer Photon Factory Keyword NiO Collection MDR XAFS DB

XAFS spectrum of Nickel(II) oxide

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ni K-edge of Nickel(II) oxide measured at Photon Factory BL-12...

Keyword:

BL-12C, Ni K-edge, NiO, Nickel(II) oxide, Oxide, Photon Factory, Si(111), XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/07/2022

XAFS spectrum of Nickel(II) oxide

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