Search Constraints
Filtering by:
Characterization methods
microscopy -- scanning transmission electron microscopy
Remove constraint Characterization methods: microscopy -- scanning transmission electron microscopy
Data origin
other
Remove constraint Data origin: other
Type of work
Dataset
Remove constraint Type of work: Dataset
Keyword
aberration correction
Remove constraint Keyword: aberration correction
Keyword
electron microscopy
Remove constraint Keyword: electron microscopy
Keyword
ptychography
Remove constraint Keyword: ptychography