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Filtering by: Funder Ministry of Education, Culture, Sports, Science and Technology Keyword TEM

Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron Microscopy

Description/Abstract:

Aberration-corrected scanning transmission electron microscopy (STEM) has been advancing resolution, sensitivity, and microanalysis due t...

Keyword:

Automation, FIB, and TEM

Resource Type:

Article

Author:

Hideyo Tsurusawa, Jun Uzuhashi, Yusuke Kozuka, Koji Kimoto, and Tadakatsu Ohkubo

Journal:

Small Methods

Date Uploaded:

02/05/2024