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Filtering by: Characterization methods microscopy -- scanning transmission electron microscopy Rights Statement Sim MIT

Description/Abstract:: Codes for Ptychographical reconstruction by WDD method and aberration measuremnt. The codes were originally developed by Katsuaki Naka...
Keyword:: ptychography, 4DSTEM, electron microscopy, Wigner distribution deconvolution, and aberration correction
Resource Type:: Software or Program Code
Data origin:: other
Author:: Nakazawa Katsuaki and Mitsuishi Kazutaka
Date Uploaded:: 01/12/2022
Date Modified:: 07/02/2023

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