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Data-based selection of creep constitutive models for high-Cr heat-resistant steel
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A universal Bayesian inference framework for complicated creep constitutive equations
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Combination of recommender system and single-particle diagnosis for accelerated discovery of novel nitrides
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High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Holder based on Geometric Characteristics of Auger Electron Spectroscopy Apparatus Equipped with Concentric Hemispherical Analyzer
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Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incidence Ion Beam
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Arイオンスパッタリングされた各種化合物半導体表面のSEM観察
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InP/GaInAsP多層膜におけるAES深さ分解能の温度依存性
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Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
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Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids over the 50 eV to 200 keV range with the relativistic full Penn algorithm
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Free Analysis and Visualization Programs for Electrochemical Impedance Spectroscopy Coded in Python
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