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Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
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HVPE
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gallium nitride
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atom probe tomography
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scanning transmission electron microscopy
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1/f noise
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Yuichi Oshima
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Jun Uzuhashi
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Tadakatsu Ohkubo
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Tetsu Kachi
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日本学術振興会
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Journal
JOURNAL OF APPLIED PHYSICS
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