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Filtering by: Journal APL Materials Remove constraint Journal: APL Materials Keyword ABF-STEM Remove constraint Keyword: ABF-STEM

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Local defect and mid-gap state analysis of GaN using monochromated EELS combined with nanodiffraction and atomic-resolution imaging

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Publication1

Keyword

4D-STEM1
ABF-STEM[remove]1
EELS1
GaN1
HAADF-STEM1
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Language

English1

Publisher

AIP Publishing1

Resource type

Article1

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open1

Rights Statement Sim

Creative Commons BY Attribution 4.0 International1

Author

Jun Kikkawa1
Koji Kimoto1
Ryoji Arai1
Sei Fukushima1
Shunsuke Yamashita1
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Journal

APL Materials[remove]1

National Institute for Materials Science

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