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Filtering by: Author Tadakatsu Ohkubo Funder Ministry of Education, Culture, Sports, Science and Technology Keyword FIB

1. Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron Microscopy

Description/Abstract:: Aberration-corrected scanning transmission electron microscopy (STEM) has been advancing resolution, sensitivity, and microanalysis due t...
Keyword:: Automation, FIB, and TEM
Resource Type:: Article
Author:: Hideyo Tsurusawa, Jun Uzuhashi, Yusuke Kozuka, Koji Kimoto, and Tadakatsu Ohkubo
Journal:: Small Methods
Date Uploaded:: 02/05/2024